Quality:
Drive Level Capacitance Profiling - Technique for characterizing semiconductor materials. Article "Drive-level capacitance profiling" in English Wikipedia has 1.8 points for quality (as of November 1, 2023).
The article also contains quality flaw template, which reduce quality score.
Since the creation of article "Drive-level capacitance profiling", its content was written by 8 registered users of English Wikipedia and edited by 8 registered Wikipedia users in all languages.
The article is cited 3 times in English Wikipedia and cited 3 times in all languages.
The highest Authors Interest rank from 2001:
- Local (English): #368260 in February 2010
- Global: #720013 in February 2010
The highest popularity rank from 2008:
- Local (English): #1362762 in February 2013
- Global: #2425850 in February 2013
There is 1 language version for this article in the WikiRank database (of the considered 55 Wikipedia language editions).
The quality and popularity assessment was based on Wikipédia dumps from November 1, 2023 (including revision history and pageviews for previous years).